Articles from Microbeam Analysis
(yearly abstracts of meetings of Microbeam Analysis Society plus several years of standalone journal)
Updated: Sept 4, 2007
 Electron Micrscopy to Electron Microprobe Analysis: The Early Years by James Hillier (Microbeam Analysis, 1989, p. 13)
 Quantitative analysis of silicate and oxide materials: Comparison of Monte Carlo, ZAF, and phi(rho Z) procedures, by John T. Armstrong (Microbeam Analysis, 1988, p. 239246)
 BenceAlbee after 20 years: Review of the accuracy of alphafactor correction procedures for oxide and silicate minerals, by John T. Armstrong (Microbeam Analysis, 1988, p. 469476).

Effects of carbon coat thickness and contamination on quantitative analysis: A new look at an old problem, by John T. Armstrong (Microbeam Analysis, Proceedings, Vol 2, Supplement 1993, p. 513514).
 An improved interference correction for trace element analysis, by John J. Donovan, Donald A. Snyder and Mark L. Rivers (Microbeam Analysis, 1993, p. 2328).
 An Improved Mean Atomic Number Background Correction for Quantitative Microanalysis, by John J. Donovan and Tracy N. Tingle (Microbeam Analysis, 1996, Vol. 2, p. 17).
 New developments in electron probe microanalysis of oxygen in wide bandgap oxides, by M. Fialin, G. Remond and C. Bonnelle (Microbeam Analysis, 1994, p. 211224).