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Recently acquired research instruments
(supported by NSF and the University of Wisconsin-Madison)
Far left: Aberration-corrected FEG-STEM (Titan 80-200) that is capable of sub-Å resolution structural and chemical imaging.
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Left: Rigaku Rapid II X-ray diffraction system with a 2-D image plate (detector) that is capable of fast and micro-diffraction, and texture analysis.
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research instruments used by the group
X-ray diffraction for characterizing and quantifying crystalline materials. (X-ray Diffraction Laboratory)
High-resolution transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), energy-filtering TEM, and associated X-ray EDS and electron energy-loss spectroscopy (EELS)
Scanning electron microscopy (SEM) and associated cathodoluminescence (CL)
Electron microprobe
Dynamic tensionmeter for quantifying surface tension, hydrophobicity, and surface energy
Microporemeter for quantifying nanopore sizes and surfaces
UV-microscope with fast scan CCD camera
Furnaces with controllable environments
Synchrotron radiation X-ray photoelectron emission microscopy (X-PEEM) for obtaining chemical images at the nano-meter scale, and X-ray absorption spectra
Synchrotron radiation infra-red (IR) spectroscopy (both transmission and reflection modes) and spectroscopic imaging
ICP-OES and ICP-MS for measuring trace elements
X-ray fluorescence (XRF) for quantifying compositions of solid samples
SIMS for spatial-resolved quantitative analyses of trace elements and stable isotopes
Research in Nano-geoscience
Research in Mineral Science
Research in Materials Science
Research Instruments