Xu Homepage | The Department of Geoscience | The University of Wisconsin-Madison

Huifang Xu - Instruments

Recently acquired research instruments
(supported by NSF and the University of Wisconsin-Madison)

Fig. 8Far left: Aberration-corrected FEG-STEM (Titan 80-200) that is capable of sub-Å resolution structural and chemical imaging.

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Left: Rigaku Rapid II X-ray diffraction system with a 2-D image plate (detector) that is capable of fast and micro-diffraction, and texture analysis.

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research instruments used by the group

X-ray diffraction for characterizing and quantifying crystalline materials. (X-ray Diffraction Laboratory)

High-resolution transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), energy-filtering TEM, and associated X-ray EDS and electron energy-loss spectroscopy (EELS)

Scanning electron microscopy (SEM) and associated cathodoluminescence (CL)

Electron microprobe

Dynamic tensionmeter for quantifying surface tension, hydrophobicity, and surface energy

Microporemeter for quantifying nanopore sizes and surfaces

UV-microscope with fast scan CCD camera

Furnaces with controllable environments

Synchrotron radiation X-ray photoelectron emission microscopy (X-PEEM) for obtaining chemical images at the nano-meter scale, and X-ray absorption spectra

Synchrotron radiation infra-red (IR) spectroscopy (both transmission and reflection modes) and spectroscopic imaging

ICP-OES and ICP-MS for measuring trace elements

X-ray fluorescence (XRF) for quantifying compositions of solid samples

SIMS for spatial-resolved quantitative analyses of trace elements and stable isotopes


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