X-ray diffraction (XRD): A Sintag Pad V automated powder XRD unit with Jade (Materials Data, Inc.) and Shaddow software for data reduction and analysis.
Microporosimeter: a new Micromeritics ASAP 2020 porosimeter that can measure BET surface area, nanopore surface area, and nanopore sizes will be installed in spring of 2005.
Atomic absorption spectrometer (AA): A Perkin-Elmer 5100PC atomic absorption spectrophotometer will be used for the concentration of metal ions in solutions.
Surface analysis system: A VCA Optima Surface Analysis System from AST Products that can measure static and dynamic contact angle and surface energy will be installed in laboratory in Spring of 2005.
Optical microscope: Olympus BX51
200 kV high-resolution Phillips CM200 Ultratwin TEM with 0.19 nm point-to-point resolution, Ge light element energy-dispersive X-ray spectroscopy (EDS) system, Gatan multi-scan CCD (charge-coupled device) camera, and full processing and analysis capabilities. NORAN Voyager 127 eV Be thin window EDS
A 120 kV energy-filtered TEM (LEO EM 912) with integrated omega filter that provides TEM imaging, electron energy-filtering TEM imaging, and electron diffraction from nanometer scale areas.
Vacuum Generators HB-501 ultra-high vacuum, field-emission gun STEM (for Z-contrast imaging) with light element EDS and parallel electron energy loss spectroscopy (PEELS)
Scanning Electron Microscopes:
A fully digital LEO GEMINI 1530 SEM with field emission electron gun, full orientation imaging based on backscattered electron Kikuchi patterns, and full EDS and control
A JSM-6100 is a modern Scanning Electron Microscope (SEM) that uses a tungsten thermionic electron source. It is an excellent general purpose SEM. The SEM is equipped with an onboard image averaging and acquisition system that greatly improves operation under difficult imaging conditions. In addition, there is a PC based active image acquisition system that allows the capture, processing, and electronic storage of high-resolution images. Other accessories include a Backscattered Electron Detector (BSE), and a full-featured PC based X-ray Energy-dispersive Analysis System (EDS).
A NORAN Instruments ADEM 30kV SEM with light element EDS and sophisticated image processing and feature analysis capabilities. The instrument has a 6-axis stage that can handle unusually large samples up to 8-inch diameter.
Focused Ion Beam (FIB): A newly installed Zeiss 1540 XBeam FESEM/FIB with in-lens secondary and backscattered detectors, gas injectors for deposition and etching, and micromanipulators for TEM sample lift-out.
XRD: Stoe X-ray diffractometer. The Stoe Instrument is a High Resolution X-ray Diffractometer. 2-theta range: 0.15 degrees to 140 degrees.
PANalytical X’Pert PRO MRD system: (high-resolution X-ray diffraction) can be configured with a hybrid monochromator or a high-resolution monochromator to fulfill high-resolution X-ray diffraction requirements. With PANalytical’s X’Pert PRO Extended MRD system, an X-ray mirror and a high-resolution monochromator can be placed in line to deliver an incident X-ray beam that is not only highly monochromatic with a low divergence, but also has a high intensity. This high intensity is used to uncover the weakest details in a diffraction experiment. X’Pert Epitaxy and Smoothfit provides functionality to analyze rocking curves, reciprocal space maps and wafer maps. Rocking curves can be simulated and fitted using patented algorithms